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Analytical Facility: X-Ray Characterization

Dr. Jiten Ghosh
Scientist B

X-Ray Characterization Section

Phone:(033) 24733496 (Ex. 3208)
FAX: +91-33-24730957
E-mail: jiten@cgcri.res.in

B.Sc (Physics), University of Burdwan
M.Sc (Physics), University of North Bengal
Ph.D (Science), National Institute of Technology (Durgapur), University of Burdwan

Research Interest
Crystal Structure Refinement & Structure Solution by Rietveld Analysis from X-ray Diffraction , Evaluation of Microstructural defects by X-ray line profile analysis, Nanostructure study from X-Ray Diffraction, Thin Film analysis by GIXRD, Phase transition and thermal behaviour study from High Temperature X-ray Diffraction, Small Angle X-Ray Scattering (SAXS) analysis for size distribution of nano-scale particles, Elemental characterization of different materials from X-Ray Fluorescence (XRF) Spectrum

Professional Career
Institution Year Position
CGCRI, Kolkata, India 2005-till date Scientist B
Dr. B. C. Roy Engineering College, Durgapur, West Bengal, India 2000 -2005 Lecturer (Physics)

Selected Publications
Publications: Summary: in SCI Journal Papers = 11; in Conference Procedings = 06;
Five Best Papers:
  1. S. Kundu, D. Bhattacharya, J. Ghosh, P. Das and P. K. Biswas, "Ferromagnetism in transparent Mn(II) -doped Indium Tin Oxide films prepared by sol-gel coating", in Chemical Physics Letters, 469 (2009) 313-317.
  2. J. Ghosh, S. K. Chattopadhyay, A. K. Meikap and S. K. Chatterjee, "Microstructure characterization of Titanium-base Aluminium alloys by X-ray diffraction using Warren-Averbach and Rietveld method", in Journal of Alloys and Compounds 453 (2008) 131-137.
  3. J. Ghosh, S. Mazumdar, M. Das, S. Ghatak, A. K. Basu, "Microstructural characterization of amorphous and nanocrystalline Boron Nitride prepared by high energy ball milling", in Materials Research Bulletin, Vol. 43 (2008) 1023-1031
  4. J. Ghosh, S. K. Chattopadhyay, A. K. Meikap, S. K. Chatterjee and S. K. Pradhan, "Study of microstructural defect parameters in Vanadium-Aluminium alloys using Warren-Averbach method and modified Rietveld technique", in Japanese Journal of Applied Physics, Vol. 44, No 9A (2005) 6678-6682.
  5. J. Ghosh, P. Mukherjee, S. K. Chattopadhyay, S. K. Chatterjee, A. K. Meikap and P. Barat, "Studies of lattice imperfections in deformed Aluminium-based Lithium alloys by X-ray diffraction", in Metallurgical and Materials Transactions A, Vol. 35 A, October (2004) 3319-3322.

Landmark Research Contribution
1. Developed model based X-ray diffraction techniques to utilize more scientific measurement data directly in the model fitting process for microstructural characterization of different materials in terms of microstructural parameters like crystallite size, lattice strain, lattice distortion, dislocation density, defect parameters (stacking faults, twining faults probabilities) etc. for structure-property correlation of materials.

    Updated on: 30-05-2010 18:54 
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