CSIR-Central Glass & Ceramic Research Institute
(A Unit of Council of Scientific and Industrial Research)

सीएसआईआर-केंद्रीय कांच और सिरेमिक अनुसंधान संस्थान
(वैज्ञानिक और औद्योगिक अनुसंधान परिषद की एक इकाई)
Dr. Sandip Bysakh
Senior Scientist & Head

Electron Microscopy Section
Materials Characterization Division

Phone: (033) 24733496 (Ex. 3299)
FAX: +91-33-24730957
E-mail: sbysakh@cgcri.res.in

B.Sc. (Tech.), Ceramic Technology, University of Calcutta
M.Sc (Engg.), Metallurgy, IISc, Bangalore
Ph.D., Metallurgy, IISc, Bangalore

Dr. Bysakh joined CGCRI on 27th September 2007

Research Interest
Analytical and High-Resolution Transmission Electron Microscopy (AEM & HRTEM) of materials, Nanostructured Thin Films by Pulsed Laser Ablation and RF Magnetron Sputtering, Laser Materials Processing, Non-equilibrium processing of materials, Atomic Force Microscopy of thin films.

Professional Career
Designation Organization Duration
Visiting Researcher "Joint State Key Laboratory for Materials Modification by Laser, Ion and Electron beams", Shanghai and Dalian, People's Republic of China, and Beijing Laboratory for Electron Microscopy, Chinese Academy of Sciences, People's Republic of China 1.4.2001 to 25.8.2001
Research Associate Indian Institute of Science, Bangalore 01.09.2001 to 29.4.2002
Center of Excellence Researcher National Institute for Materials Science, Tsukuba, Japan 01.05.2002 - 31.03.2004
Scientist C Defence Metallurgical Research Laboratory, Hyderabad 12.07.2004 - 25.09.2007
Scientist E1 Central Glass & Ceramic Research Institute, Kolkata 27.09.2007 - till date

  • Visiting Scientist Fellowship during April-August, 2001, State Key Laboratories for Materials Modification by Laser, Ion and Electron Beam, Shanghai and Dalian, China.
  • Post Doctoral Fellow during May 2002 - April 2004 in National Institute for Materials Science, Tsukuba, JAPAN.

Selected Publications
Publications: Summary: in SCI Journal Papers = 47; in Conference Procedings = 02;
Selected papers (5):
  1. "Role of TiO2 seed layer thickness on the nanostructure evolution and phase transformation behavior of sputtered PZT thin films during post-deposition air-annealing", Ankita Bose, Monjoy Sreemany and Sandip Bysakh. ‘Journal of the American Ceramic Society’, 2011, Volume 94, 4066 - 4077.
  2. "Formation of amorphous xenon nanoclusters and microstructure evolution in pulsed laser deposited Ti62.5Si37.5 thin films during Xe ion irradiation", S. Bysakh, K. Mitsuishi, M. Song, K. Furuya and K. Chattopadhyay. ‘Journal of Materials Research’, 2011, volume 26, 62 - 69.
  3. "Mechanisms of nano-hole drilling due to nano-probe intense electron beam irradiation on a stainless steel" S. Bysakh, M. Shimojo, K. Mitsuishi and K. Furuya ?Journal of Vacuum Science and Technology B, 2004, volume 22, 2620 - 2627.
  4. "A Study of Nanostructures of Thin Films in B-C-N System Produced by Pulsed Laser Deposition (PLD) and Nitrogen Ion-Beam Assisted PLD" S. Bysakh, K. Chattopadhyay, L. H. Hao, J. D. Wu, C. Dong, Y. Q. Wang, X. F. Duan and K. H. Kuo, Journal of Materials Research, 2004, volume 19, pages 759 - 767.
  5. "Characterization of Microstructure in Laser Surface Alloyed Layers of Aluminium on Nickel" S. Bysakh, S. K. Mitra, G. Phanikumar, J. Majumder, P. Dutta and K. Chattopadhyay, Metallurgical and Materials Transactions A?, 2003, volume 34A, pages 2621 - 2631.

Patents filed / Granted

Summary: 1 (Japan,applied)
  • "The method of processing materials to the nano- meter order" Shimojo Masayuki, Sandip Bysakh and Furuya Kazuo
    Application number patent application 2004-75350, application day 2004.3.16

Landmark Research Contribution
Development of pulsed laser deposition technique for deposition of thin films of advanced materials, intermetallic thin films, Development of PZT thin films for sensor application in structural health monitoring.

    Updated on: 17-05-2012 19:11 
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