CSIR-Central Glass & Ceramic Research Institute
A Unit of Council of Scientific and Industrial Research

सीएसआईआर-केंद्रीय काँच एवं सिरामिक अनुसंधान संस्थान
वैज्ञानिक और औद्योगिक अनुसंधान परिषद की एक इकाई
(An ISO 9001:2015 Certified Institute)
  ::  Areas of research of CMD  ::  

Areas of research
  • Development of atomic and molecular spectroscopic techniques using Inductively Coupled Plasma Mass Spectrometry (ICP MS), Inductively Coupled Plasma Atomic Emission Spectrometry (ICP AES), Flame Atomic Absorption Spectrometry (FAAS), UV–VIS Spectrophotometry
  • Development of solid phase extraction technique using polyurethane foam (PUF) for separation, pre-concentration and analysis of trace and ultra trace elements
  • Development of chemical processes for separation and removal of toxic elements from waste water
  • Developments of analytical methods for the extraction of precious metals from waste materials
  • Qualitative & quantitative phase analysis in materials using X-Ray Diffractometry (XRD) technique and study of kinetics of growing oxide scales and low to high temperature phase transition using non-ambient XRD
  • Crystal structure refinement & structure solution, modeling of structures and evaluation of microstructural parameters like cystallite size, lattice strain, stacking faults (deformation faults & twin faults), dislocation density and cell parameters etc from X-ray diffraction line profile analysis using Rietveld multiphase analysis program packages for better understanding of composition-structure-properties correlation.
  • Study of surface microstructure and nanostructure of various ceramics and glass using Scanning Electron Microscope (SEM) and Field Emission SEM fitted with EDX spectrometer
  • Imaging and micro structural characterization of nanostructured materials using analytical High Resolution Transmission Electron Microscope (TEM) fitted with EDX spectrometer & thin film surface study by Atomic Force Microscope (AFM)
  • Development of ferroelectric/piezoelectric and Transition-metaloxide based thin film materials for sensors and transistors.
  • Microstructure Characterization of Ceramics, Composites, Glass and Thin Films by TEM, FESEM, AFM and XPS.
  • Study of Rheological and magnetoreological properties of Ferro fluids and MR fluids
  • Study of thermal (DTA, TGA, DSC, viscosity) and physical characteristics (particle size, surface area, porosimetry) of different glass and ceramic materials and evaluation of specific heat, phase transitions, softening point and glass transition temperatures, viscous and elastic modulus, creep and yield study and pore size and its morphology thereof.
  • Gas chromatography and mass spectroscopy
  • Study of electrical conductivity of SiO2-PbO-K2O glass systems and SiO2-B2O5-K2 glass nodules in the molten condition
  • Development, characterization, calibration and telemetry of sensors for application in bio medical structures

    Updated on: 16-05-2012 16:38 
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