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Divisional Facilities

Central Materials Characterization Facility (CMCF)

Central Materials Characterization Facility

STA 449, RT to 1600, Netzsch

Twin Surface area analyzer, Quantachrome)

Dilatometer (RT to 1600o C), Netzsch

Rheometer, Malvern

Rheometer with magneto rheology attachment

Microparticle Analyzer, Methrom

Zetasizer, Malvern

Gas Pycnometer, Micromeritics

Inductively Coupled Plasma Mass Spectrometer (ICP-MS), Perkin-Elmer

Inductively Coupled Plasma Atomic Emission Spectrometer (ICP-AES), Spectro Analytical

Flame Atomic Absorption Spectrophotometer (FAAS), Perkin Elmer

UV-VIS Spectrophotometer

Flame Photometer

Carbon Analyser, LECO

Nitrogen & Oxygen Analyser, LECO

    Updated on: 18-11-2015 14:02 
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